A MEMS electron impact ion source integrated in a microtime-of-flight mass spectrometer - Concepedia

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A MEMS electron impact ion source integrated in a microtime-of-flight mass spectrometer

24

Citations

12

References

2013

Year

Charles-Marie Tassetti, Romain Mahieu, Jean-Sébastien Danel, Olivier Peyssonneaux, Frédéric Progent, Jean-Philippe Polizzi, Xavier Machuron‐Mandard, Laurent Duraffourg

Sensors and Actuators B Chemical

EngineeringPhysicsMicrofabricationMedicineMicrotime-of-flight Mass SpectrometerMass SpectrometryApplied PhysicsCollision Cross SectionIon BeamInstrumentationIon EmissionMicroelectronicsIon Mobility

References

	Year	Citations

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