Analysis of electrical characteristics of Er/p-InP Schottky diode at high temperature range

Extraction of Schottky diode parameters from forward current-voltage characteristics

S. K. Cheung, N.W. Cheung · Applied Physics Letters · 1986 · 2.7K citations

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Barrier inhomogeneities at Schottky contacts

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Engineering, Electrical Engineering, Materials Science +17

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

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Engineering, Materials Engineering, Materials Science +14

Metal-semiconductor contacts

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On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriers

Y.P. Song, R.L. Van Meirhaeghe, W.H. Laflère et al. · Solid-State Electronics · 1986 · 560 citations

Engineering, Materials Engineering, Materials Science +14