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On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriers

Electrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsElectronic EngineeringApplied PhysicsCurrent-voltage-temperature MeasurementsApparent BarrierAl/p-inp Schottky BarriersMicroelectronicsElectrical Insulation