Concepedia

On the difference in apparent barrier height as obtained from capacitance-voltage and current-voltage-temperature measurements on Al/p-InP Schottky barriers

Y.P. Song, R.L. Van Meirhaeghe, W.H. Laflère, F. Cardon

Solid-State Electronics · 1986 · 560 citations · 18 references

DOI

Concepts

References

18

The structure and properties of metal-semiconductor interfaces

L. J. Brillson · Surface Science Reports · 1982 · 924 citations

, , +12

Current transport in metal-semiconductor barriers

C.R. Crowell, Simon M. Sze · Solid-State Electronics · 1966 · 714 citations

, , +14

Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier System

Alvin M. Goodman · Journal of Applied Physics · 1963 · 449 citations

, , +17

Normalized thermionic-field (T-F) emission in metal-semiconductor (Schottky) barriers

C.R. Crowell, V.L. Rideout · Solid-State Electronics · 1969 · 410 citations

, , +10

Carrier transport across metal-semiconductor barriers

C. Chang, Simon M. Sze · Solid-State Electronics · 1970 · 253 citations

, , +14