Effect of gold on surface properties and leakage current of MOS transistors

Measurement of Strains at Si-SiO2 Interface

R. J. Jaccodine, William A. Schlegel · Journal of Applied Physics · 1966 · 403 citations

Natural Sciences, Materials Engineering, Materials Science +17

Characteristics of the metal-Oxide-semiconductor transistors

C. T. Sah · IEEE Transactions on Electron Devices · 1964 · 279 citations

Engineering, Electrical Engineering, Materials Science +16

The silicon insulated-gate field-effect transistor

S.R. Hofstein, F.P. Heiman · Proceedings of the IEEE · 1963 · 262 citations

Engineering, Electrical Engineering, Microelectronics +16

Stabilization of Silicon Surfaces by Thermally Grown Oxides*

Mena Atalla, Eileen Tannenbaum, E. J. Scheibner · Bell System Technical Journal · 1959 · 257 citations

Natural Sciences, Materials Engineering, Materials Science +17

Oxygen Content of Silicon Single Crystals

W. Kaiser, P. H. Keck · Journal of Applied Physics · 1957 · 253 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15