F.P. Heiman

The effects of oxide traps on the MOS capacitance

F.P. Heiman, G. Warfield · IEEE Transactions on Electron Devices · 1965 · 435 citations

Semiconductors, Device Modeling, Electrical Engineering +13

The silicon insulated-gate field-effect transistor

S.R. Hofstein, F.P. Heiman · Proceedings of the IEEE · 1963 · 262 citations

Device Modeling, Electrical Engineering, Semiconductor Device +11

On the determination of minority carrier lifetime from the transient response of an MOS capacitor

F.P. Heiman · IEEE Transactions on Electron Devices · 1967 · 222 citations

Semiconductors, Room Temperature, Electrical Engineering +15

Use of HCl Gettering in Silicon Device Processing

P. H. Robinson, F.P. Heiman · Journal of The Electrochemical Society · 1971 · 68 citations

Materials Science, Sintering, Engineering +4

Thin-film silicon-on-sapphire deep depletion MOS transistors

F.P. Heiman · IEEE Transactions on Electron Devices · 1966 · 62 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +12