Empirical Modeling of Electromigration Early Resistance Changes

Atomistic and computer modeling of metallization failure of integrated circuits by electromigration

R. Kirchheim, U. Kaeber · Journal of Applied Physics · 1991 · 123 citations

Engineering, Electrical Engineering, Materials Science +17

Electromigration interconnect lifetime under AC and pulse DC stress

B.K. Liew, N.W. Cheung, Chenming Hu · 1989 · 43 citations

Engineering, Electrical Engineering, Materials Science +17

<i>In</i> <i>situ</i> observations of dc and ac electromigration in passivated Al lines

E. Castaño, J. Maiz, P. A. Flinn et al. · Applied Physics Letters · 1991 · 40 citations · Full text

Engineering, Materials Engineering, Materials Science +17

High Resolution Observation of Void Motion in Passivated Metal Lines Under Electromigration Stress

Michael C. Madden, Edward V. Abratowski, T. Marieb et al. · MRS Proceedings · 1992 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +17

Study of Electromigration-Induced Resistance and Resistance Decay in A1 Thin Film Conductors

James R. Lloyd, R. H. Koch · Reliability physics · 1987 · 16 citations

Natural Sciences, Electrical Engineering, Materials Science +17