Radiation hardness studies of the front-end ASICs for the optical links of the ATLAS SemiConductor Tracker

Damage correlations in semiconductors exposed to gamma, electron and proton radiations

G.P. Summers, E.A. Burke, P. Shapiro et al. · IEEE Transactions on Nuclear Science · 1993 · 551 citations

Engineering, Electrical Engineering, Materials Science +17

Hardness-assurance and testing issues for bipolar/BiCMOS devices

R.N. Nowlin, Daniel M. Fleetwood, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 1993 · 104 citations · Full text

Engineering, Electrical Engineering, Electronic Materials +16

Energy Dependence of Proton-Induced Displacement Damage in Gallium Arsenide

E.A. Burke, C.J. Dale, A.B. Campbell et al. · IEEE Transactions on Nuclear Science · 1987 · 70 citations

Engineering, Electrical Engineering, Materials Science +17

Time development and flux dependence of neutron-irradiation induced defects in silicon pad detectors

D. Žontar, V. Cindro, G. Kramberger et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1999 · 65 citations

Engineering, Electrical Engineering, Nuclear Engineering +17

Radiation damage due to NIEL in GaAs particle detectors

A. Chilingarov, Julia S. Meyer, T. Sloan · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1997 · 42 citations · Full text

Engineering, Electrical Engineering, Nuclear Engineering +14