Applied Surface Science · 1998 · 20 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistrySurface ChemistrySurface ScienceScanning Probe MicroscopySemiconductor InterfacesSemiconductor SurfacesSilicon MaterialsSurface CrystallographySurface PhysicsMicroscopyScanning Tunneling SpectroscopySilicon Surface ScienceSurface Defects Characterization
10
Neutralization of Shallow Acceptor Levels in Silicon by Atomic Hydrogen
J. I. Pánkové, David Carlson, J. E. Berkeyheiser et al. · Physical Review Letters · 1983 · 455 citations