Concepedia

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Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs

DOI

21

Citations

25

References

2002

Year

N. Stojadinović, I. Manić, S. Djoric-Veljković, V. Davidović, S. Golubović, Sima Dimitrijev
Microelectronics Reliability

References

YearCitations

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