Dual vibrational high frequency magnetic force microscopy

Abstract

The ability to evaluate high frequency writer performance is crucial to the write-head designs for high data rate application. To quantify the write-head performance at high frequency (∼1 GHz), a new high frequency detection approach has been implemented. The essence of the method is to utilize a two-step signal mixing process to produce the force harmonics, which are not only proportional to the amplitude of the deep-gap field but also fall within the active bandwidth of the probe spectrum. Furthermore, a dual-vibration detection scheme is also described, which can provide superior high spatial resolution and enhance the sensitivity of attractive mode force microscopy as well at high frequencies.