Single Event Upset Rate Predictions for Complex Logic Systems

Alpha-particle-induced soft errors in dynamic memories

T.C. May, M. H. Woods · IEEE Transactions on Electron Devices · 1979 · 853 citations

Natural Sciences, Computer Engineering, Physics +17

Cosmic Ray Induced in MOS Memory Cells

J.C. Pickel, J. T. Blandford · IEEE Transactions on Nuclear Science · 1978 · 176 citations

Engineering, Computer Engineering, Electrical Engineering +15

Calculation of Cosmic-Ray Induced Soft Upsets and Scaling in VLSI Devices

E.L. Petersen, P. Shapiro, James H. Adams et al. · IEEE Transactions on Nuclear Science · 1982 · 155 citations

Engineering, Computer Engineering, Electrical Engineering +17

Cosmic-Ray-Induced Errors in MOS Devices

J.C. Pickel, J. T. Blandford · IEEE Transactions on Nuclear Science · 1980 · 147 citations

Engineering, Computer Engineering, Electrical Engineering +17

Suggested Single Event Upset Figure of Merit

E.L. Petersen, J.B. Langworthy, S. E. Diehl · IEEE Transactions on Nuclear Science · 1983 · 131 citations

Natural Sciences, Electrical Engineering, Physics +9