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Can atomic force microscopy tips be inspected by atomic force microscopy?
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1991
Year
Atomic Force MicroscopyEngineeringMicroscopyImage Prospective TipsElectron MicroscopyMicroscopy MethodNanometrologyInstrumentationLight MicroscopyBiophysicsMaterials ScienceNanotechnologyForce Microscopy TipsMicrostructureDiamond-like CarbonMicrofabricationScanning Probe MicroscopySurface ScienceMaterials CharacterizationApplied PhysicsScanning Force MicroscopyMedicineTungsten Tips
An attempt has been made to image prospective tips by atomic force microscopy. The apex of mounted diamond fragments and of traditional metallic tips was investigated by the same diamond probe. The peculiar tip–tip configuration allowed to search for the effect of sample rotation on the images. Identical images were obtained when the diamond stylus scanned different etched tungsten tips, illustrating an interchange in the roles of tip and sample.