I. Heyvaert

Scanning tunneling microscopy observation of self-affine fractal roughness in ion-bombarded film surfaces

J. Krim, I. Heyvaert, C. Van Haesendonck et al. · Physical Review Letters · 1993 · 318 citations

Engineering, Microscopy, Tunneling Microscopy +17

Immobilizing and imaging microtubules by atomic force microscopy

Anja Vinckier, I. Heyvaert, A D'Hoore et al. · Ultramicroscopy · 1995 · 65 citations

Atomic Force Microscopy, Microscopy, Microscopy Method +5

Preparation and structural characterization of thin epitaxial Bi2Sr2CaCu2O8+δ films with Tc in the 90 K range

Patrick Wagner, F. Hillmer, Urban Frey et al. · Physica C Superconductivity · 1993 · 52 citations

Materials Engineering, Materials Science, Structural Characterization +7

Etching of screw dislocations in YBa2Cu3O7 films with a scanning tunneling microscope

I. Heyvaert, E. Osquiguil, C. Van Haesendonck et al. · Applied Physics Letters · 1992 · 45 citations

Materials Engineering, Materials Science, Material Analysis +15

Can atomic force microscopy tips be inspected by atomic force microscopy?

L. Hellemans, Koen Waeyaert, Frans Hennau et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 33 citations

Atomic Force Microscopy, Engineering, Microscopy +20