Applied Surface Science · 2001 · 192 citations · 30 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSpectroscopyOxide SemiconductorsPhotoelectron SpectroscopySemiconductor Device MaterialsSemiconductor PhysicsSemiconductor SurfacesX-ray Photoelectron SpectroscopyNanostructured OxidesOxide Electronic StructureSemiconductor Characterization
30
XPS analysis of gallium oxides
R. Carli, Claudia L. Bianchi · Applied Surface Science · 1994 · 208 citations
Natural Sciences, Materials Engineering, Materials Science +8
J. Massies, J. P. Contour · Journal of Applied Physics · 1985 · 136 citations
Natural Sciences, Materials Engineering, Materials Science +17