Adaptive Wearout Management with in-situ aging monitors

V. Huard, F. Cacho, F. Giner, M. Saliva, A. Benhassain, Darayus Adil Patel, Nestor Alonso Torres, S. Naudet, Abhishek Jain, C. Parthasarathy

2014 · 14 citations · 4 references

Concepts

Abstract

In this work, the fundamental elements towards an Adaptive Wearout Management (AWM) of digital circuits are presented including a new generation of in-situ aging monitors. The warning flags allow circuits to execute instructions in a fault-free way with large power savings up to 40%.

References

4