M. Saliva

BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

D. Angot, V. Huard, Lama Rahhal et al. · 2013 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +17

Impact of the gate-stack change from 40nm node SiON to 28nm High-K Metal Gate on the Hot-Carrier and Bias Temperature damage

A. Bravaix, Yoann Mamy Randriamihaja, V. Huard et al. · 2013 · 30 citations

Engineering, Electrical Engineering, Materials Science +17

Technology scaling and reliability: Challenges and opportunities

V. Huard, F. Cacho, X. Federspiel et al. · 2015 · 26 citations

Engineering, Computer Engineering, Computer Systems +13

New insights about oxide breakdown occurrence at circuit level

M. Saliva, F. Cacho, V. Huard et al. · 2014 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +17

Digital Circuits Reliability with In-Situ Monitors in 28nm Fully Depleted SOI

M. Saliva, F. Cacho, V. Huard et al. · Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 · 2015 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +15