Improved approaches to the determination of residual stresses in micro regions with the KOSSEL and the XRT technique

Abstract

Abstract A new application of the KOSSEL and the XRT (X‐ray Rotation‐Tilt) technique arises from local residual stress measurements in micro regions. Already in 1996/97, we started to conduct such investigations based on the KOSSEL method. Because of the high lateral resolution residual stresses of the third kind can be determined. Some further evaluation procedures are described. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

References

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	Year	Citations
Innovative Analysis of X-ray Microdiffraction Images on Selected Applications of the Kossel Technique Jürgen Bauch, J. Brechbühl, H.‐J. Ullrich, Crystal Research and Technology X-ray SpectroscopyEngineeringMicroscopyElectron DiffractionPolycapillary Optics	1999	27
Excitation of Kossel patterns by synchrotron radiation H.‐J. Ullrich, Matthias Schlaubitz, F. Friedel, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Synchrotron Radiation ResearchEngineeringPhysicsRadiation GenerationApplied Physics	1994	24
A comparison of the KOSSEL and the X‐ray Rotation‐Tilt Technique Jürgen Bauch, H.‐J. Ullrich, M. Böhling, Crystal Research and Technology	2003	19
Kossel and pseudo Kossel CCD pattern in comparison with electron backscattering diffraction diagrams S. Däbritz, Enrico Langer, W. Hauffe Applied Surface Science Materials ScienceEngineeringPhysicsDiffraction DiagramsElectron Spectroscopy	2001	17
Measurements of Residual Stresses in Micron Regions by Using Synchrotron Excited Kossel Diffraction J. Brechbühl, Jürgen Bauch, H.‐J. Ullrich Crystal Research and Technology	1999	17
X-ray Rotation-Tilt-Method — First Results of a new X-ray Diffraction Technique Jürgen Bauch, H.‐J. Ullrich, D. Reiche Crystal Research and Technology X-ray CrystallographyEngineeringHealth SciencesPhysicsXrt Method	2000	14

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