A comparison of the KOSSEL and the X‐ray Rotation‐Tilt Technique

Abstract

Abstract There are world‐wide efforts to analyse micron regions of compact samples by means of X‐ray diffraction (“X‐ray Microdiffraction”). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X‐ray Rotation‐Tilt Method (XRT), are compared to show their possibilities and limitations. Some selected examples of new applications are presented.