Measurements of Residual Stresses in Micron Regions by Using Synchrotron Excited Kossel Diffraction

Abstract

In 1996, we performed the first measurements of residual stresses by using synchrotron excited Kossel diffraction (at the beamline L of the HASYLAB, Hamburg). Our first findings as well as the principle of the determination procedure for obtaining residual stresses from Kossel lines are presented. The Kossel technique is a very suitable method for fast measurements of local residual stresses in micron regions. Because of the high lateral resolution even residual stresses of third order (inhomogeneities of the stress state within a grain) can be proved and calculated.