Innovative Analysis of X-ray Microdiffraction Images on Selected Applications of the Kossel Technique

Abstract

Starting from the origin and the informational content of Kossel interferences excited by electron and synchrotron radiation beams selected examples of microstructural applications, such as the precision determination of lattice constants, the precision determination of crystallographic orientation of single grains, the determination of local stresses/strains and the determination of tetragonal distortions of cubic lattices including the description of a variety of methods for analysis are presented.