Concepedia

Valence band studies of the formation of ultrathin pure silicon nitride films on Si(100)

Ali Bahari, Per Morgen, Zehao Li

Surface Science · 2006 · 24 citations · 14 references

DOI

Concepts

References

14

Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction

Kunio Takayanagi, Y. Tanishiro, Shigeki Takahashi et al. · Surface Science · 1985 · 1.1K citations

, , +14

High-resolution depth profiling in ultrathin Al2O3 films on Si

E. P. Gusev, M. Copel, E. Cartier et al. · Applied Physics Letters · 2000 · 412 citations

, , +17

Core-level spectroscopy of the clean Si(001) surface: Charge transfer within asymmetric dimers of the 2×1 and<i>c</i>(4×2) reconstructions

E. Landemark, C. J. Karlsson, Yimin Chao et al. · Physical Review Letters · 1992 · 382 citations

, , +17

Electronic structure and optical properties of α and β phases of silicon nitride, silicon oxynitride, and with comparison to silicon dioxide

Yong‐Nian Xu, W. Y. Ching · Physical review. B, Condensed matter · 1995 · 209 citations

, , +17

Valence-band electronic structure of silicon nitride studied with the use of soft-x-ray emission

R. D. Carson, S. E. Schnatterly · Physical review. B, Condensed matter · 1986 · 74 citations

, , +17