Surface Topography Characterization Using an Atomic Force Microscope Mounted on a Coordinate Measuring Machine

A Uniform Concept for Calibration, Acceptance Test, and Periodic Inspection of Coordinate Measuring Machines Using Reference Objects

H. Kunzmann, E. Trapet, F. Wäldele · CIRP Annals · 1990 · 118 citations

Uniform Concept, Engineering, Measurement +16

Progress in 3D Surface Microtopography Characterization

P.M. Lonardo, H. Trumpold, Leonardo De Chiffre · CIRP Annals · 1996 · 106 citations

Geometric Modeling, Engineering, Surface Microtopography Characterization +11

Industrial Uses of STM and AFM * *Contribution of the National Institute of Standards and Technology. Not subject to copyright except for illustrations taken from other sources.

Theodore V. Vorburger, John A. Dagata, Günter Wilkening et al. · CIRP Annals · 1997 · 61 citations

Engineering, Other Sources, Industrial Engineering +4

Advantages and Industrial Applications of Three-Dimensional Surface Roughness Analysis

Leonardo De Chiffre, S. Christiansen, S. Skade · CIRP Annals · 1994 · 41 citations

Geometric Modeling, Industrial Applications, Engineering +6

Roughness Parameters of Surfaces by Atomic Force Microscopy

K. Carneiro, Carsten P. Jensen, Jan Friis Jørgensen et al. · CIRP Annals · 1995 · 39 citations

Materials Science, Engineering, Microfabrication +6