Surface Topography Characterization

Surface Topography Characterization is a metrological methodology that specifies the three-dimensional arrangement and fine-scale geometric features of nanostructured surfaces through quantitative analysis of surface morphology, distinguishing it from bulk material characterization by its exclusive focus on localized, nanoscale spatial variations.

535

Publications

23.5K

Citations

1.7K

Authors

627

Institutions

Publications per year

2017–2026

142

Authors

1.7K

  1. ŞŢ
    Ştefan Ţălu

    Technical University of Cluj-Napoca, Romania

    23 publications · 1.1K citations

    17

    h-index

  2. RL
    Richard Leach

    University of Nottingham, United Kingdom

    12 publications · 506 citations

    12

    h-index

  3. SS
    Shahram Solaymani

    Islamic Azad University, Science and Research Branch, Iran

    9 publications · 391 citations

    9

    h-index

  4. XJ
    Xiangqian Jiang

    University of Huddersfield, United Kingdom

    9 publications · 738 citations

    9

    h-index

  5. PP
    Paweł Pawlus

    Rzeszów University of Technology, Poland

    8 publications · 360 citations

    8

    h-index

1–5 of 1.7K

Venues

  1. Surface Science

    21 publications · 888 citations

    17

    h-index

  2. Wear

    19 publications · 1.4K citations

    16

    h-index

  3. Materials

    14 publications · 375 citations

    13

    h-index

  4. Surface Topography Metrology and Properties

    STMP · 13 publications · 784 citations

    12

    h-index

  5. Measurement Science and Technology

    13 publications · 682 citations

    12

    h-index

1–5