Statistics
Publications
88
Citations
5.7K
H-Index
37
Active since
1976
Leonardo De Chiffre is an author at Technical University of Denmark specializing in engineering, manufacturing engineering, and metrology.
Publications per year
1976–2020
88
88
Computed tomography for dimensional metrology
Jean‐Pierre Kruth, Markus Bartscher, Simone Carmignato et al. · CIRP Annals · 2011 · 672 citations
Engineering, Manufacturing Engineering, Biomedical Imaging +11
Industrial applications of computed tomography
Leonardo De Chiffre, Simone Carmignato, Jean‐Pierre Kruth et al. · CIRP Annals · 2014 · 649 citations
Engineering, Industrial Engineering, Manufacturing Engineering +12
Metrology of freeform shaped parts
Enrico Savio, Leonardo De Chiffre, Robert Schmitt · CIRP Annals · 2007 · 381 citations
Engineering, Manufacturing Engineering, Geometric Modeling +9
Dimensional Micro and Nano Metrology
Hans Nørgaard Hansen, K. Carneiro, Han Haitjema et al. · CIRP Annals · 2006 · 326 citations
Surfaces in Precision Engineering, Microengineering and Nanotechnology
Leonardo De Chiffre, H. Kunzmann, G.N. Peggs et al. · CIRP Annals · 2003 · 221 citations
Natural Sciences, Materials Engineering, Materials Science +12
1–5 of 88