Concepedia

Publication | Closed Access

FinFET and MOSFET preliminary comparison of gate oxide reliability

DOI

11

Citations

5

References

2006

Year

R. Fernández, R. Rodríguez, M. Nafrı́a, X. Aymerich, B. Kaczer, G. Groeseneken
Microelectronics Reliability

References

YearCitations

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