Triton Surfactant as an Additive to KOH Silicon Etchant

Abstract

Anisotropic etching of Si (100) and (110) planes in alkaline solutions containing the nonionic surfactant is studied in this paper. Triton X-100 surfactant, normally used for the modification of TMAH (tetramethylammonium hydroxide) etchant, is added to KOH (potassium hydroxide) solution. As a result, the (100) and (110) etch rates are significantly reduced and the etch rate ratio is obtained. The influence of KOH concentration (at 10 and 100 ppm (v/v) of the surfactant) on the etching process is also investigated. Low roughness of (110) surface is achieved in the 2M KOH solution containing Triton. The smooth {110} sidewall planes inclined at 45° toward the (100) substrate are fabricated by etching in the KOH + Triton solution. The 45° {110} sidewalls are potentially attractive as MEMS micromirrors for optical beam reflection at an angle of 90°. The low etch rate of (100) plane is kind of a disadvantage of the fabrication method, but it can be fairly overcome by elevating the process temperature and stirring the etching solution.