Testing and built-in self-test – A survey

Principles and methods of testing finite state machines-a survey

D. Lee, Mihalis Yannakakis · Proceedings of the IEEE · 1996 · 1.2K citations

Computing, Computer Engineering, Computer Science +13

An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits

 Goel · IEEE Transactions on Computers · 1981 · 1.1K citations

Engineering, Computer Engineering, Computer Science +12

Built-in test for VLSI: Pseudorandom techniques

Integration · 1989 · 866 citations

Engineering, Computer Engineering, Electrical Engineering +12

A logic design structure for LSI testability

E. B. Eichelberger, T.W. Williams · Design Automation Conference · 1977 · 837 citations

Engineering, Computer Engineering, Computer Systems +14

On the Acceleration of Test Generation Algorithms

Fujiwara, Shimono · IEEE Transactions on Computers · 1983 · 823 citations

Engineering, Computer Engineering, Computer Science +9