Ohmic behaviour of Au/WSiN/(Au,Ge,Ni)-n-GaAs systems

Electron microscope studies of an alloyed Au/Ni/Au-Ge ohmic contact to GaAs

T. S. Kuan, P. E. Batson, Thomas N. Jackson et al. · Journal of Applied Physics · 1983 · 232 citations

Engineering, Materials Engineering, Materials Science +17

Effects of interfacial microstructure on uniformity and thermal stability of AuNiGe ohmic contact to <i>n</i>-type GaAs

Yih-Cheng Shih, Masanori Murakami, E. L. Wilkie et al. · Journal of Applied Physics · 1987 · 186 citations

Engineering, Materials Engineering, Materials Science +17

A new GaAs technology for stable FETs at 300 degrees C

K. Fricke, H.L. Hartnagel, R. J. Schutz et al. · IEEE Electron Device Letters · 1989 · 48 citations

Engineering, Electrical Engineering, Materials Science +17

Thermally stable ohmic contacts to <i>n</i>-type GaAs. II. MoGeInW contact metal

Masanori Murakami, W. H. Price, Yih-Cheng Shih et al. · Journal of Applied Physics · 1987 · 43 citations

Engineering, Electrical Engineering, Materials Science +17

Thermal stability of WSiN-GaAs and Au-WSiN interfaces

Hirohiko Sugahara, Nagano Jin · Applied Surface Science · 1990 · 17 citations

Engineering, Materials Engineering, Materials Science +14