Applied Surface Science · 1990 · 17 citations · 4 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesThermal Properties Of MaterialsThermal Properties Of SemiconductorsWide Band Gap SemiconductorsSemiconductor StabilityThermal Management Of Semiconductor DevicesThermal StabilityThermal Stability Of NanostructuresTwo-dimensional Semiconductor Interfaces
4
The physics of semiconductor devices
R. H. Rediker · Solid-State Electronics · 1970 · 1.6K citations
Diffusion barriers in thin films
M.−A. Nicolet · Thin Solid Films · 1978 · 684 citations
Natural Sciences, Materials Engineering, Materials Science +10
Characterization of WSi<i>x</i>/GaAs Schottky contacts
T. Ohnishi, N. Yokoyama, Hidetoshi Onodera et al. · Applied Physics Letters · 1983 · 79 citations
Thermal stability of WSi<i>x</i>/GaAs interface
Shinichiro Takatani, Naoya Matsuoka, J. Shigeta et al. · Journal of Applied Physics · 1987 · 40 citations