The complete doping profile using MOS CV technique

Physics of Semiconductor Devices

Samarth Jain, S. Radhakrishna · 1987 · 4.2K citations

Engineering, Electrical Engineering, Physics +12

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

Lewis M. Terman · Solid-State Electronics · 1962 · 1.4K citations

Engineering, Materials Engineering, Materials Science +14

A quasi-static technique for MOS C-V and surface state measurements

Markus Kühn · Solid-State Electronics · 1970 · 553 citations

Natural Sciences, Materials Science, Physics +13

Interpretation of surface and bulk effects using the pulsed MIS capacitor

D.K. Schroder, J. Guldberg · Solid-State Electronics · 1971 · 158 citations

Natural Sciences, Materials Engineering, Materials Science +13

Impurity Distribution in Epitaxial Silicon Films

Candice Thomas, D. Kahng, R. C. Manz · Journal of The Electrochemical Society · 1962 · 134 citations · Full text

Engineering, Electrical Engineering, Materials Science +17