Publication | Closed Access
A quasi-static technique for MOS C-V and surface state measurements
552
Citations
8
References
1970
Year
Surface CharacterizationElectrical EngineeringEngineeringPhysicsQuasi-static TechniqueElectron SpectroscopySurface AnalysisSurface ScienceCondensed Matter PhysicsApplied PhysicsAtomic PhysicsInstrumentationElectronic InstrumentationMicroelectronics
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