Publication | Closed Access
Noncontact AFM imaging on Al-adsorbed Si(111) surface with an empty orbital
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Citations
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References
2000
Year
Materials ScienceSurface CharacterizationNoncontact AfmEngineeringMicroscopyOptical PropertiesEmpty OrbitalSurface ScienceApplied PhysicsScanning Probe MicroscopySurface AnalysisAl-adsorbed SiSilicon On InsulatorSurface Reconstruction
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