Science · 1995 · 332 citations · 14 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSolid State PhysicsSurface ScienceAtomic Force MicroscopyDefect CharacterizationDefectsScanning Probe MicroscopySurface MicroscopySurface PhysicsAtomic Force Microscopy Surface AnalysisAtomic-resolution ImagingAtomic-scale Surface ImagingHigh-resolution ImagingImaging ResolutionNoncontact Atomic Force MicroscopyPoint DefectsTip-sample Interactions
With an atomic force microscope operating in the noncontact mode in an ultrahigh vacuum, atomic-resolution imaging of the cleaved semi-insulating InP(110) surface has been achieved. By this method, atomic scale point defects and their motion were observed at room temperature, without the field-induced effects associated with scanning tunneling microscopy.
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G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text
Positioning single atoms with a scanning tunnelling microscope
D. M. Eigler, E. K. Schweizer · Nature · 1990 · 3.1K citations
Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
Franz J. Gießibl · Science · 1995 · 1.2K citations · Full text