Lattice vibrations in hexagonal Ga1−xMnxN epitaxial films on c-plane sapphire substrates by infrared reflectance spectra

Abstract

The lattice vibrations of undoped hexagonal Ga1−xMnxN (x from 0.0% to 1.5%) epitaxial films grown on c-plane sapphire substrates by metalorganic chemical vapor deposition have been investigated using infrared reflectance spectra in the frequency region of 200–2000cm−1 (5–50μm) at room temperature. The experimental reflectance spectra were analyzed using the Lorentz oscillator model for infrared-active phonon observed. The E1(LO) phonon frequency slightly decreases with increasing Mn composition. However, the E1(TO) phonon frequency linearly increases with the Mn composition, which can be well expressed by (558.7+350x)cm−1 and the broadening values are found to be larger than that of the GaN film. It indicates that Mn incorporation decreases the peak values (from the E1 phonon) of the infrared dielectric functions due to the local variation in the lattice constants and to the destruction of the crystal translational symmetry.