Full-chip reliability analysis

An introduction to probability theory and its applications

Journal of the Franklin Institute · 1958 · 30K citations

Natural Sciences, Mathematics, Probability Theory +11

Electromigration in thin aluminum films on titanium nitride

I. A. Blech · Journal of Applied Physics · 1976 · 1.2K citations

Engineering, Materials Engineering, Materials Science +17

Stress evolution due to electromigration in confined metal lines

M. A. Korhonen, P. Bo rgesen, K. N. Tu et al. · Journal of Applied Physics · 1993 · 733 citations

Engineering, Electrical Engineering, Materials Science +17

A model for conductor failure considering diffusion concurrently with electromigration resulting in a current exponent of 2

M. Shatzkes, J. R. Lloyd · Journal of Applied Physics · 1986 · 302 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Mass Transport of Aluminum by Momentum Exchange with Conducting Electrons

James R. Black · Physics of failure in electronics · 1967 · 222 citations

Natural Sciences, Electrical Engineering, Materials Science +15