Analysis and future trend of short-circuit power

Abstract

A closed-form expression for short-circuit power dissipation of CMOS gates is presented which takes short-channel effects into consideration. The calculation results show good agreement with the SPICE simulation results over wide range of load capacitance and channel length. The change in the short-circuit power, P/sub S/, caused by the scaling in relation to the charging and discharging power, P/sub D/, is discussed and it is shown that basically power ratio, P/sub S//(P/sub D/+P/sub S/), will not change with scaling if V/sub TH//V/sub DD/ is kept constant. This paper also handles the short-circuit power of series-connected MOSFET structures which appear in NAND and other complex gates.