Defect-centric perspective of time-dependent BTI variability - Concepedia

Concepedia

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Defect-centric perspective of time-dependent BTI variability

22

Citations

34

References

2012

Year

M. Toledano-Luque, B. Kaczer, J. Franco, Ph. Roussel, Tibor Grasser, G. Groeseneken

Microelectronics Reliability

ReliabilityReliability EngineeringEngineeringMeasurementUncertainty QuantificationDefect-centric PerspectiveBias Temperature InstabilityComputer EngineeringSystems EngineeringCircuit ReliabilityDefect Tolerance

References

	Year	Citations

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