Investigation of native-oxide growth on HF-treated Si(111) surfaces by measuring the surface-state distribution - Concepedia

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Investigation of native-oxide growth on HF-treated Si(111) surfaces by measuring the surface-state distribution

45

Citations

27

References

1994

Year

H. Angermann, Th. Dittrich, H. Flietner

Applied Physics A

Materials ScienceSurface CharacterizationEngineeringSurface AnalysisSurface ScienceApplied PhysicsSurface EngineeringSurface ReactivityHf-treated SiSilicon On InsulatorMicroelectronicsNative-oxide GrowthSurface-state Distribution

References

	Year	Citations

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