Publication | Closed Access
Investigations on hydrophilic and hydrophobic silicon (100) wafer surfaces by X-ray photoelectron and high-resolution electron energy loss-spectroscopy
410
Citations
22
References
1986
Year
Materials ScienceWafer SurfacesSurface CharacterizationWafer Scale ProcessingEngineeringHydrophobic SiliconSurface AnalysisSurface ScienceApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorX-ray Photoelectron
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