Use of the charge pumping technique with a sinusoidal gate waveform

A reliable approach to charge-pumping measurements in MOS transistors

G. Groeseneken, H.E. Maes, N. Beltran et al. · IEEE Transactions on Electron Devices · 1984 · 1.4K citations

Engineering, Electrical Engineering, Materials Science +17

Spectroscopic charge pumping: A new procedure for measuring interface trap distributions on MOS transistors

G. Van den bosch, G. Groeseneken, Paul Heremans et al. · IEEE Transactions on Electron Devices · 1991 · 121 citations

Engineering, Electrical Engineering, Materials Science +17

A general model for interface-trap charge-pumping effects in MOS devices

U. Cilingiroglu · Solid-State Electronics · 1985 · 41 citations

Engineering, Electrical Engineering, Materials Science +16

A model for the charge-pumping current based on small rectangular voltage pulses

R. Wachnik, Jeremiah R. Lowney · Solid-State Electronics · 1986 · 30 citations

Engineering, Electrical Engineering, Physics +8