A model for the charge-pumping current based on small rectangular voltage pulses

Statistics of the Recombinations of Holes and Electrons

W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations

Engineering, Electrical Engineering, Recombination +15

A reliable approach to charge-pumping measurements in MOS transistors

G. Groeseneken, H.E. Maes, N. Beltran et al. · IEEE Transactions on Electron Devices · 1984 · 1.4K citations

Engineering, Electrical Engineering, Materials Science +17

A charge-sheet model of the MOSFET

J.R. Brews · Solid-State Electronics · 1978 · 555 citations

Engineering, Computer Engineering, Electrical Engineering +12

Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements

R. Castagné, A. Vapaille · Surface Science · 1971 · 526 citations

Engineering, Materials Engineering, Materials Science +14

Charge pumping in MOS devices

J.S. Brugler, P.G.A. Jespers · IEEE Transactions on Electron Devices · 1969 · 499 citations

Engineering, Electrical Engineering, Materials Science +17