J.R. Brews - Concepedia

Author

J.R. Brews

University of Arizona

Also Known As

J Suehle, J. Brews, J. R. Brews, J.R. Brews, JOHN R. BREWS, John Brews, John R Brews, John R. Brews

Publications

5.5K

Citations

H-Index

Concepts

All Affiliations

University of Arizona Nokia (United States)Naval Surface Warfare Center AT&T (United States)Mathematical Sciences Research Institute

About

J.R. Brews is an author at University of Arizona specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	31	50	3K
2	Applied Physics	26	35	1.9K
3	Natural Sciences	5	5	182
4	Education	3	3	167
5	Chemical Engineering	1	1	11

J.R. Brews

Publications

3.2K

Citations

H-Index

Page 1

	Year	Citations
A charge-sheet model of the MOSFET J.R. Brews Solid-State Electronics Device ModelingElectrical EngineeringEngineeringNanoelectronicsCircuit Simulation	1978	549
Generalized guide for MOSFET miniaturization J.R. Brews, Wolf Fïchtner, E. H. Nicollian, IEEE Electron Device Letters Numerical AnalysisDevice ModelingElectrical EngineeringEngineeringTechnology Scaling	1980	356
Rapid interface parameterization using a single MOS conductance curve J.R. Brews Solid-State Electronics Device ModelingElectrical EngineeringEngineeringApplied PhysicsCircuit Simulation	1983	114
Measuring the effective channel length of MOSFETs K.K. Ng, J.R. Brews IEEE Circuits and Devices Magazine Measurement TheoryEngineeringMeasurementMeasurement Standards (Educational Assessment)Accuracy And Precision	1990	105
Subthreshold behavior of uniformly and nonuniformly doped long-channel MOSFET J.R. Brews IEEE Transactions on Electron Devices Device ModelingSemiconductorsElectrical EngineeringSubthreshold Turnoff BehaviorEngineering	1979	97
Surface Potential Fluctuations Generated by Interface Charge Inhomogeneities in MOS Devices J.R. Brews Journal of Applied Physics EngineeringCharge TransportSemiconductor DeviceMos DevicesNanoelectronics	1972	93
Transmission line models for lossy waveguide interconnections in VLSI J.R. Brews IEEE Transactions on Electron Devices Electrical EngineeringEngineeringMicrowave TransmissionElectrical TransmissionTransmission Line Models	1986	92
A conceptual model of a single-event gate-rupture in power MOSFETs J.R. Brews, M. Allenspach, Ronald D. Schrimpf, IEEE Transactions on Nuclear Science	1993	92
SEGR and SEB in n-channel power MOSFETs M. Allenspach, C. Dachs, G.H. Johnson, IEEE Transactions on Nuclear Science Hardware SecurityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	1996	91
Impact of oxide thickness on SEGR failure in vertical power MOSFETs; development of a semi-empirical expression J.L. Titus, C.F. Wheatley, D.I. Burton, IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringMono-energetic Ion BeamsNanoelectronicsSegr Failure	1995	83

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