Microelectronics Reliability · 1999 · 18 citations · 4 references
EngineeringElectrical EngineeringMicroelectronicsPower ElectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice ReliabilityDevice SimulationSemiconductor ReliabilityWide-bandgap Semiconductor DevicesAging CharacterizationAging Degradation AnalysisLifetime EstimationLifetime PredictionLifetimesReliability Analysis Of Power ElectronicsTechnical Lifetime
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Thermal characterization of IGBT power modules
P. Cova, Mauro Ciappa, G. Franceschini et al. · Microelectronics Reliability · 1997 · 22 citations · Full text