Publication | Closed Access
Advantages of HfAlON gate dielectric film for advanced low power CMOS application
18
Citations
3
References
2005
Year
Low-power ElectronicsElectrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsApplied PhysicsTime-dependent Dielectric BreakdownSemiconductor Device FabricationMicroelectronicsElectrical Insulation
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