Journal of Electronic Materials · 2000 · 88 citations · 12 references
Natural SciencesMaterials EngineeringMaterials ScienceMechanical Behavior Of MaterialsSurface ScienceThin FilmsStress RelaxationStress-strain BehaviorThin Film Mechanical PropertiesThin Film StrainViscoelastic BehaviorViscoelastic PropertiesFilm StrainFilm-substrate InteractionMechanical Properties Of FilmsOxide Film AdhesionStrain RelaxationStress Relaxation MechanismsViscoelastic EffectsViscosity
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Silicon on insulator material technology
M. Bruel · Electronics Letters · 1995 · 1K citations
Dislocation-free InSb grown on GaAs compliant universal substrates
Felix Ejeckam, M. L. Seaford, Yu‐Hwa Lo et al. · Applied Physics Letters · 1997 · 93 citations