Microelectronics Reliability · 2012 · 251 citations · 22 references
EngineeringElectrical EngineeringFault-tolerant ComputingFault-tolerant SystemsMicroelectronicsDevice CharacterizationDevice ReliabilityFailure CriteriaFailure Mode AnalysisMemory DevicesReliability ModelingGate Oxide ReliabilityProbabilistic Reliability AnalysisStress-induced Failure
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