Journal of Alloys and Compounds · 2004 · 39 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceAnalytical ChemistryElemental AnalysisMaterials ChemistryDevice CharacterizationElectronic Material CharacterizationElemental Composition AnalysisX-ray Photoelectron SpectroscopySemiconductor Characterization
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Static Charge Fluctuations in Amorphous Silicon
L. Ley, Juergen Reichardt, R. L. Johnson · Physical Review Letters · 1982 · 125 citations · Full text