M. Kruczek

Electronic structure of AgNbO3 and NaNbO3 studied by X-ray photoelectron spectroscopy

M. Kruczek, E. Talik, A. Kania · Solid State Communications · 2006 · 58 citations

Natural Sciences, Materials Engineering, Materials Science +14

Characterisation of Pb(Mn1/3Nb2/3)O3 ceramics by SEM, XRD, XPS and dielectric permittivity tests

A. Molak, E. Talik, M. Kruczek et al. · Materials Science and Engineering B · 2005 · 58 citations

Natural Sciences, Materials Engineering, Materials Science +14

XPS characterisation of neodymium gallate wafers

E. Talik, M. Kruczek, H. Sakowska et al. · Journal of Alloys and Compounds · 2004 · 39 citations

Natural Sciences, Materials Engineering, Materials Science +8

XPS studies of chemically etched surfaces of (La,Sr)(Al,Ta)O3 single crystals

E. Talik, M. Kruczek, H. Sakowska et al. · Journal of Alloys and Compounds · 2003 · 39 citations

Natural Sciences, Materials Engineering, Materials Science +16

X‐ray photoelectron spectroscopy investigations of Y₃Al₅O₁₂:Yb single crystal

M. Kruczek, E. Talik, H. Sakowska et al. · Crystal Research and Technology · 2005 · 27 citations

Natural Sciences, Chemistry, Materials Science +17