A reliable technology concept for active power cycling to extreme temperatures

On the Origin of Thermal Runaway in a Trench Power MOSFET

Donald Dibra, Stefan Decker, Andreas Lindemann et al. · IEEE Transactions on Electron Devices · 2011 · 68 citations

Engineering, Electrical Engineering, Microelectronics +16

Fast thermal fatigue on top metal layer of power devices

S. Russo, R. Letor, O. Viscuso et al. · Microelectronics Reliability · 2002 · 42 citations

Engineering, Materials Engineering, Materials Science +16

Measurement and Simulation of Self-Heating in DMOS Transistors up to Very High Temperatures

Martin Pfost, Joachim Joos, Matthias Stecher · 2008 · 41 citations

Engineering, Computer Engineering, Electrical Engineering +17

Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions

Microelectronics Reliability · 2004 · 37 citations

Engineering, Electrical Engineering, Materials Science +17

3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET

J.B. Sauveplane, P. Tounsi, E. Scheid et al. · Microelectronics Reliability · 2008 · 19 citations

Engineering, Electrical Engineering, Materials Science +12