A reliable technology concept for active power cycling to extreme temperatures

On the Origin of Thermal Runaway in a Trench Power MOSFET

Donald Dibra, M. Stecher, Stefan Decker et al. · IEEE Transactions on Electron Devices · 2011 · 67 citations

Electrical Engineering, Power Mosfet, Engineering +12

Fast thermal fatigue on top metal layer of power devices

S. Russo, R. Letor, O. Viscuso et al. · Microelectronics Reliability · 2002 · 42 citations

Electrical Engineering, Engineering, Hardware Reliability +12

Measurement and Simulation of Self-Heating in DMOS Transistors up to Very High Temperatures

Martin Pfost, Joachim Joos, Matthias Stecher · 2008 · 41 citations

Engineering, Semiconductor Device, Electronic Devices +23

Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions

Microelectronics Reliability · 2004 · 37 citations

Electrical Engineering, Engineering, Nanoelectronics +10

3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET

J.B. Sauveplane, P. Tounsi, E. Scheid et al. · Microelectronics Reliability · 2008 · 19 citations

Electrical Engineering, Engineering, Hardware Reliability +10