O. Viscuso

Fast thermal fatigue on top metal layer of power devices

S. Russo, R. Letor, O. Viscuso et al. · Microelectronics Reliability · 2002 · 42 citations

Electrical Engineering, Engineering, Hardware Reliability +12

The early oxynitridation stages of hydrogen-terminated (100) silicon after exposure to N2:N2O. III. Initial conditions

G. F. Cerofolini, C. Galati, Simona Lorenti et al. · Applied Physics A · 2003 · 33 citations

Chemical Engineering, Engineering, Surface Science +8

X-ray photoemission spectroscopy study at different takeoff angles of hydrosilation of 1-alkynes at hydrogen-terminated 1×1-reconstructed (100)-oriented silicon

G. F. Cerofolini, C. Galati, S. Reina et al. · Materials Science and Engineering C · 2003 · 20 citations

Engineering, Physics, Crystalline Defects +8

Evidence for the precursors of nitrided silicon in the early stages of silicon oxynitridation in N2:N2O atmosphere

G. F. Cerofolini, M. Camalleri, C. Galati et al. · Applied Physics Letters · 2001 · 17 citations

Engineering, N2o Atmosphere, Broad N +16

X-ray-photoemission-spectroscopy evidence for anomalous oxidation states of silicon after exposure of hydrogen-terminated single-crystalline (100) silicon to a diluted N2 : N2O atmosphere

G. F. Cerofolini, C. Galati, L. Renna et al. · Journal of Physics D Applied Physics · 2002 · 17 citations

Si 2P, N2o Atmosphere, Crystalline Defects +14